Professor
Classification:
Faculty
Ph.D (University of Nebraska, 1982)
Research interest: Atomic and molecular physics; nano technology; nondestructive inspection (NDI); instrumentation and measurement science; microelectronics.
Dr. Dennis Mueller investigates the interactions of electrons with atoms by scattering electrons and atom beams. Also, he is playing an active part in the development of a portable X-ray diffraction instrument for application to characterization of metallurgical samples.