"Materials Analysis and Modifications using Ion Beams"
Dr. Bibhudutta Rout
UNT - Physics
Tuesday, October 2, 2012
3:30 p.m., Room 104, Physics Building
3:15 p.m., Room 104
Abstract: Energetic (keV - MeV) Ion beams have been used for materials analysis and synthesis in a wide range of fields involving semiconductors to biomaterials. Recent advances in the manufacturing process, ion optics theory and computer control systems have led to the development of high spatial resolution (micro-nano meter) High Energy Focused Ion Beam Systems (HEFIB). In this talk, I will present a summary of our research work on the development of new generation HEFIB systems and applications of ion beams in materials analysis and synthesis.