Dr. Rout has been awarded an NSF grant in collaboration with Dr. Swapnajit Chakravarty at University of Dayton to develop a low-cost hand-held device to test for and identify diseases and biohazards. The project will utilize a smart cut technique available at the UNT Ion Beam Laboratory to exfoliate thin films to develop fabrication tolerant silicon nanophotonic sensors. Project activities will include outreach to broaden the participation of minority students in STEM education and training. The project will help to address the significant current need to build US-based manpower in the design and manufacturing of semiconductor chips.

More details about the project abstract can be found at NSF.