Scanning Electron Microscope | COXEM CX-200Plus | Department of Physics

Scanning Electron Microscope | COXEM CX-200Plus

Specifications:

  • Magnification: 15-300,000X
  • Spatial Resolution: <3nm at 30 kilovolts (kV)
  • Vacuum Mode: High Vacuum
  • Acceleration Voltage: 1 - 30kV (adjustable in 1kV scale)
  • Electron Source: Pre-Centered Tungsten Filament
  • Detector: Secondary Electron Detector [SED(DP)], Back Scattering Electron Detector [BSED(DP)]
  • Sample Size: 160mm in Diameter
  • X,Y/ Z/ T Traverse R: 0-60 mm / 5-60mm/ -20 - 90º, 360º
  • Automation: Focus, Filament, Brightness/Contrast

Operation Manual for COXEM CX-200Plus